Q. Mottling due to X ray diffraction can be identified by:

(A) Noting a large change between two successive exposures with the test piece rotated slightly about the beam axis
(B) Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis
(C) Noting a characteristic pattern corresponding to the lattice spacing
(D) None of the above

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✅ Correct Answer: (B) Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis

Published by Mr. Dubey ⭐ 111.54K Points at 21-Sep-2023 07:19 pm in Non Destructive Testing and Evaluation

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