M

Mr. Dubey • 100.64K Points
Coach

Q. Mottling due to X ray diffraction can be identified by:

  • (A) Noting a large change between two successive exposures with the test piece rotated slightly about the beam axis
  • (B) Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis
  • (C) Noting a characteristic pattern corresponding to the lattice spacing
  • (D) None of the above
Share

No solution found for this question.
Add Solution and get +2 points.

You must be Logged in to update hint/solution

Discusssion

Login to discuss.

Related MCQs

Q. The chief advantage of using a water washable penetrant process is:

Q. Which of the following material can bear sudden and excessive shocks better?

Q. The linear velocity of the reciprocating roller follower when it has contact with the straight flanks of the tangent cam, is given by

Q. With increase in the mass velocity of the gas, the rate of drying during the constant rate period __________, if the conduction and radiation through

Q. The phenomenon of boiling the milk in an open container when milk spills over the vessel is termed as

Q. Oil in journal bearing should be applied at the point where load is

Q. The gauge factor for doped crystal is in the range

Q. Minimum work in compressor is possible when the value of adiabatic index n is equal to

Q. The maximum permissible turbidity for drinking water

Q. Which relay is used on transmission lines?

Question analytics