πŸ“Š Digital Principles and System Design
Q. In this iterative test generation method, sequential logic is
  • (A) used in the same pattern
  • (B) converted to test logic
  • (C) converted to combinational logic
  • (D) converted to asynchronous logic
πŸ’¬ Discuss
βœ… Correct Answer: (C) converted to combinational logic

Explanation: in this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs.


Explanation by: Mr. Dubey
in this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs.

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